QSSPC technique monitors the material quality during fabrication process. Lifetime data is interpreted and open-circuit voltage (versus illumination) curve is mapped.
(Standard offline wafer life-time tool: WCT-120)
Suns-Voc stage is usually attached with WCT-120. It displays standard I-V curve format as well as the Suns-Voc curve. The measurement is at open circuit so the effect of series resistance is negligible.
Parameters reported for each measurement: