Atomic Force Spectroscopy

Agilent 5420 SPM/ Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy. It is one of the foremost tools for imaging, measuring, and manipulating matter at the nano-scale. The information is gathered by "feeling" the surface with a mechanical probe.  Different conducting cantilevers used for scanning depend on the mode and the type of the sample. AFM operation is usually described as one of the following modes, according to the nature of the tip motion:

Contact Mode

  • ACAFM  (Alternating Current Atomic Force Microscopy)
  • EFM (Electric Force Microscopy)
  • KFM (Kelvin Force Micros)
  • STM  (Scanning Tunneling Microscopy)
  • SMM  (Scanning Microwave Microscopy)
  • CSAFM (Current Sensing Atomic Force Microscopy)

It is    particularly  useful for    semiconductor       test     and characterization. It can be used to acquire  calibrated     capacitance  and dopant density measurements and to enable complex impedance (resistance and reactance) measurements. It works   on all major semiconductor types, glasses, polymers, ceramics, and metals.


  • Study the organic   films, membranes, and biological samples.
  • Agilent’s Software
  • PicoView is a highly stable software package that   offers real-time 3D rendering capabilities. It allows control of scanning parameters   and provides the flexibility         required       for     more complex experiments.


  • High resolution camera and video system
  • X-Y and Z large scanner (90µm x 90µm  x   8µ)
  • X-Y and Z small scanner (8µm  x 8µm x 2µ)
  • Noise: 0.5A.
  • Controller

  1. Input: Ten   16-bit channels
  2. Drive:          5       channels       ±        215V,          24-bit
  3. Output:        Four  24-bit channels,      ±        10V


  • Materials science
  • Polymers
  • Electrical characterization
  • General surface characterization
  • Nanolithography
  • Biological sciences


Kuwait University